Low-Boom SR-71 Modified Signature Demonstration Program

Lux, David and Ehernberger, L.J. and Moes, Timothy R. and Haering, Edward A. (1999) Low-Boom SR-71 Modified Signature Demonstration Program. In Proceedings High-Speed Research: 1994 Sonic Boom Workshop – Configuration Design, Analysis, and Testing, pages 237-248, Hampton, Virginia.

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Abstract

A flight program using the SR-71 airplane to validate sonic boom technologies for High-Speed Commercial Transport (HSCT) operation and potentially for low- or softened-boom design configurations is described. This program employs a shaped signature modification to the SR-71 airplane which is designed to demonstrate computational fluid dynamics (CFD) design technology at a full-scale HSCT operating condition of Mach 1.8 at 48,000 feet altitude. Test plans call for measurements in the near-field, at intermediate propagation altitudes, and through the more turbulent boundary layer near the Earth surface. The shaped signature modification to the airplane is comprised of added cross-section areas on the underside of the airplane forward of the wing and engine nacelles. Because the flight demonstration does not approach maximum SR-71 altitude or Mach number, the airplane provides more than adequate performance and maneuver margins for safe operation of the modified airplane. Probe airplane measurements in the near-field will use fast response pressure sensors. Far-field and ground-based boom measurements will use high response microphones or conventional sonic boom field recorders. Scope of the planned demonstration flights also includes ground level measurements during conditions which cause minimal signature distortion and conditions which cause high distortion of the signature.

EPrint Type:	Conference or Meeting Presentation
Keywords:	SR-71 airplane
Subjects:	Aircraft/Project: SR-71 Blackbird
ID Code:	1709
Deposited On:	17 September 2007
Additional Information:	12 pages. In NASA/CP-1999-209699, High-Speed Research: 1994 Sonic Boom Workshop – Configuration Design, Analysis, and Testing, pages 237-248.