Skip Top nav bar link group topnav end piece go to business section go to education section go to history section go to gallery section go to news section go to organizations section go to research section go to search engine go to site index topnav end piece
NASA Meatball Banner of Dryden Flight Research Center
white space
Image of gray corner
Dryden Technical Reports Server banner with text and picture of a book
[Home] [About] [Browse] [Search] [User Area] [Help]

Current Loop Signal Conditioning: Practical Applications

Anderson, Karl F. (1995) Current Loop Signal Conditioning: Practical Applications. Technical Report NASA TM-4636, Research Engineering, NASA Dryden Flight Research Center.

Full text available as:
PDF - Requires Adobe Acrobat Reader or other PDF viewer.

Abstract

This paper describes a variety of practical application circuits based on the current loop signal conditioning paradigm. Equations defining the circuit response are also provided. The constant current loop is a fundamental signal conditioning circuit concept that can be implemented in a variety of configurations for resistance-based transducers, such as strain gages and resistance temperature detectors. The circuit features signal conditioning outputs which are unaffected by extremely large variations in lead wire resistance, direct current frequency response, and inherent linearity with respect to resistance change. Sensitivity of this circuit is double that of a Wheatstone bridge circuit. Electrical output is zero for resistance change equals zero. The same excitation and output sense wires can serve multiple transducers. More application arrangements are possible with constant current loop signal conditioning than with the Wheatstone bridge.

EPrint Type:NASA Technical Memorandum
Keywords:Bridge circuits, Circuit theory, Electrical engineering, Electronic circuits, Electronic test equipment, Electronics, Gages, Instrumentation, Measuring instruments, Remote sensors, Resistance temperature detectors, Resistors, Sensors, Strain gage instruments, Structural testing, Test facility instruments, Testing of materials, Transducers
Subjects:(31 - 39) Engineering: (35) Instrumentation and Photography
ID Code:218
Deposited On:16 July 2004
Additional Information:22 pages. Presented at the 1995 Measurement Science Conference, Anaheim, California, January 26–27, 1995.
blank space image of gray corner

 

Last Modified: September 14, 2004
Responsible NASA Official: Jenny Baer-Riedhart
Webmasters

NASA Web Privacy Statement